We specialize in Transverse Interferometry the most sensitive fiber measurement technology available. Our exclusive patent-pending Multi-Wavelength Optical Fiber Refractive Index Profiling Technology was first presented.
We specialize in Transverse Interferometry, the most sensitive fiber measurement technology available.
Our exclusive patent-pending Multi-Wavelength Optical Fiber Refractive Index Profiling Technology was first presented as Postdeadline Paper PDP A2 at OFC/NFOEC 2009 and has since been the subject of peer reviewed conference and journal publications. Since the measurement is performed transversely (through the side of the fiber), it is essentially non-destructive. Although the fiber’s polymer coating or buffer must be removed, the fiber itself can continue to carry an optical signal during the measurement, and if necessary the polymer coating can be restored to the fiber after the measurement is completed.
No cleave required
Sub-μm spatial resolution
Applicable to any fiber type
Fast measurement time
Measure splices, tapers, couplers
Refractive index accuracy
~ 500 nm
500 nm to 1 μm
40 μm to 400 μm
Silica glass, non-silica glass plastic
Concentricity error measurement
+/− 200 nm
Core non-circularity error measurement
+/− 0.4 %
singlemode, multimode, microstructured (PCF), PM, multicore, rare-earth, cladding-pumped, large mode area, low bend loss, high-Δ, etc.