All-In-One Laser Beam Profiler & High Resolution Wavefront Sensor
High Resolution CCD Beam Profiler
Instant Beam Propagation & Wavefront Analysis
One Shot M2 Measurement
The BeamWave sensors deliver intensity and wavefront measurements simultaneously in an all-in-one device. Instead of using microlens array for wavefront sampling, these sensors are based on Digital Wavefront Technology ®, hence the number of wavefront measurement points is only limited by camera resolution providing a high spatial resolution wavefront, These sensors are typically used for either simultaneous laser beam profiling and beam propagation analysis or high resolution wavefront measurement for optical elements characterization.
With no moving parts or additional accessories, BeamWave® performs all critical laser beam measurements including intensity distribution, wavefront and beam propagation parameters.
High Resolution Beam Profiling
Real Time Wavefront Measurement
Low and high Order Aberrations
BeamWave provides high resolution wavefront data, these useful parameters allows laser beam analysis in its all dimensions.
On Click Beam Propagation Analysis
One Shot M²
Intensity distribution at any selected plane
Thanks to it capability to measure simultaneously phase and intensity, BeamWave delivers beam propagation analysis, thus providing an instant picture of laser beam behavior along the propagation axis.
Beam propagation parameters, relative power density, wavefront, and intensity in any plane are measured with the same device.No mechanical mounts, stepper motors or moving stages. No maintenance cost of moving devices. No mechanical adjustments during lifetime of the instrument. No bulky systems for measuring several parameters are needed.
Simultaneous high‐resolution intensity & wavefront
Acquisition of intensity is made directly on CCD chip, reconstruction of wavefront is performed by software.
No need to acquire a two distinct instruments (beam profiler & wavefront sensor) to obtain same measurement
Detailed profile of the beam in an arbitrary plane
One shot M² measurement of both CW and pulsed lasers
Calculation of M², divergence, collimation and other beam propagation parameters of both CW and pulsed lasers is made by software.
No need of additional instrumentation, saving time and costs
Measurement are highly repeatable
Measurement of even misaligned lasers are performed
Instant measurement of the entire beam over the broad range around focal region
Beam propagation computed by software from simultaneous intensity and wavefront acquisition.
Save time for laser beam adjustment
Predictive laser beam analysis
BeamWave sensors come with GetLase® GUI software for Instant diagnostic of all laser beam parameters and GetWave ® GUI software with comprehensive wavefront analysis tools including, Zernike, MTF and PSF. GUI software XP, Vista and Windows 7 compatible, performs intensity and wavefront acquisition in a remarkably fast and easy way and provides comprehensive tools for beam profiling including intensity distribution and beam propagation parameters.
Acquisition & Display
Automatic calibration & acquisition
Live display 2D and 3D intensity, wavefront, PSF
Single and continuous acquisition
Beam intensity parameters: Maximum intensity levels; Ellipticity of the beam spot
Beam spot major and minor axis dimensions
Beam propagation parameters: M² parameter for the X and Y directions; Waist size in X and Y directions] Distance between camera position and waist planes; Rayleigh range; Divergence angle of the beam; PSF, Strehl ratio; Real‐time Zernike display and analysis; Profiles of wavefront and intensity
Export & Report
BeamWave sensors come with GetLase® GUI software for Instant diagnostic of all laser beam parameters and GetWave ® GUI software with comprehensive wavefront analysis tools including, Zernike, MTF and PSF.
Successfully used for applications such as:
Real Time Laser Beam Monitoring
Instant Laser Beam Diagnostic
Laser Diodes, fiber Lasers, semiconductors Lasers
Solid state lasers, lasers Telecom assemblies
Optics characterization : microlenses and ophthalmic lenses
SIMULTANEOUS INTENSITY AND WAVEFRONT ANALYSIS: High resolution intensity and wavefront provided by Digital Wavefront Technology®
HIGH RESOLUTION WAVEFRONT MEASUREMENT: Spatial wavefront mapping only limited by camera resolution, no microlens array sampling
ALL IN ONE DEVICE FOR BEAM MONITORING: Beam profiling including intensity distribution and beam propagation parameters in a single device
|Maximum input beam diameter (1/e²), mm||3.2||4.8||6.4||10.88x8.16|
|Beam Intensity Measurements?||CW & Pulsed Lasers in XY for any Z||CW & Pulsed Lasers in XY for any Z||CW & Pulsed Lasers in XY for any Z||CW & Pulsed Lasers in XY for any Z|
|Wavelength range, nm||350 ‐1100||350 ‐1100||350 –1100||2000-16000|
|Measures M²?||CW and Pulsed lasers||CW and Pulsed lasers||CW and Pulsed lasers||CW and Pulsed lasers|
|M²range||1 to >50||1 to >50||1 to >50|
|M²repeatability||< 2%||< 2%||<2%|
|Phase/Wavefront measurements possible?||yes||yes||yes|
|Wavefront and Intensity XY resolution, um||6.45||6.45||6.45||17|
|Wavefront Measurement Points||500 x 500||1392 x 1040||1392 x 1040||640x480|
|Wavefront Sensitivity (λ), rms||0.005||0.005||0.005||0.01|
|Wavefront Accuracy (λ), rms||0.01||0.01||0.001|
|Wavefront Dynamic Range (λ)||1 500||1 500||1800||1500|
|Computer interface||USB 2.0||2 x USB 2.0||USB 2.0||USB 2.0|
|Dimensions, mm||41 x 55 x 80||87 x 161 x 84||114W x 72 x 171||61x67x66|
STC Series Laser Beam Profilers
1. VIS/NIR Laser Beam Profiler: STCam CCD
Our CCD is developed to provide excellent sensitivity from the VIS to NIR spectral range. Thanks to its high resolution and its small pixel size, the STCam is a high performance tool for laser beam analysis of continuous wave (CW) and pulsed laser modes. Due to its high dynamic range the STCam captures even higher laser modes with outstanding detail.
The passive cooled sensor of the STCam is constructed without cover glass to avoid interference patterns. For sensor protection a low distortion neutral density filter is integrated. The STCam supports the ultra-fast FireWire IEEE 1394b interface with data transfer rates up to 800 Mbit/s. The plug and play
design facilitates easy and flexible integration and operation.
The portable STCam is designed to be used in a variety of applications in industry, science, research and development, including:
Laser beam analysis of CW and pulsed lasers,
Quick control of laser modes and adjustment errors,
Test equipment for scientific research,
Near-Field and Far-Field analyses of lasers, LED devices and other light sources.
The enhancement of product quality, process reliability and efficiency are just a few of the many benefits of our unique beam profiler cameras. The STCam includes the specifically designed analysis software, STRayCi, which supports Windows XP/Vista operating systems. Its sophisticated software architecture opens up new opportunities in laser beam analysis according to ISO standards.
The concept of the STCam enables easy adaption to standard optical imaging systems, attenuators and opto-mechanical components ensuring highest flexibility. This includes:
Microscope lens and beam expander,
UV-Converter and IR-Converter,
Fixed and variable attenuators, etc.
Neutral Density Filter:To expand the power range of the STCam several absorptive and metallic-coated neutral density filters are available, which are specified by optical densities ranging from OD 1.0 to OD 4.0.
FireWire Component:We offer different FireWire PCI / PCI Express cards for installation direct into the PC. Standard FireWire cables are suitable for industrial applications and are available in various lengths.
Trigger Device:To synchronize the STCam with pulsed laser systems, our trigger device is perfectly suited. This frequency and delay generator is software controllable and enables the synchronization of up to four beam profilers with different delay times simultaneously.
|Number of pixel||1388x1038 (1.4MPixel)||1388x1038 (1.4MPixel)||2452x2056 (5MPixel)|
|Spectral response without cover glass||350-1100nm||350-1100nm||350-1100nm|
|Laser beam diameter min/max||46.5/4mm||64.5μm/5mm||34.5μm/5.5mm|
|Bit depth (output)||14Bit||14Bit||14Bit|
|Dynamic (signal to noise)||60dB (1:1000)||67dB (1:2200)||54dB (1:500)|
|Frame rate||up to 15Hz||up to 16Hz||up to 9Hz|
|Interface||FireWire (IEEE1394b)||FireWire (IEEE1394b)||FireWire (IEEE1394b)|
|I / O connector||12-Pin Hirose||12-Pin Hirose||12-Pin Hirose|
|Mode||CW or pulsed||CW or pulsed||CW or pulsed|
|Combinable with||IR-/UV-Converter Beam expander Attenuator||Beam expander Attenuator||Beam expander Attenuator|
|Mechanical dimensions (WxHxL)||60x60x103.8mm||60x60x103.8mm||60x60x103.8mm|
|Electrical requirements||DC 8V-36V||DC 8V-36V||DC 8V-36V|
|Regulations||CE, RoHS||CE, RoHS||CE, RoHS|
* without condensation
Neutral Density Filter
Our neutral density filters allow broadband attenuation for a spectral range from VIS to NIR. Due to their excellent surface quality the absorptive and reflective filters enable precise beam attenuation for low power applications. The level of attenuation is specified by the optical density. Filters with different optical densities can be combined. A filter adapter is available to mount the filters on the STCam aperture.
|Reflective ND filter||Absorptive ND filter|
|NDR-10 / NDR-20 / NDR-30 / NDR-40||NDA-10 / NDA-20 / NDA-30 / NDA-40|
|Optical density*||1.0 / 2.0 / 3.0 / 4.0||1.0 / 2.0 / 3.0 / 4.0|
|Spectral range||200nm - 1200nm||400nm - 700nm / 700nm - 1200nm|
|Material||UV-Fused silica (Coating: Metal)||Schott glass|
|Flatness||1λ @ 300nm||λ/10 @ 632.8nm|
|Scratch-Dig||40 - 20||40 - 20|
|Optical density tolerance||±5%||±5%|
|Power (Pmax)||< 1W||< 1W|
|Operating temperature||< 100°C||< 100°C|
|Filter threads||Filter thread / Filter mount||Filter thread / Filter mount|
|Filter adapter||C-Mount thread / Filter thread||C-Mount thread / Filter thread|
2. Laser Beam Profiling Software STRayCi
Our sophisticated beam profilers are available with the specifically designed analysis software, STRayCi, which supports Windows XP/Vista operating systems. It is available as 32 Bit / 64 Bit version and can control up to eight beam profiler cameras on a single computer.
Due to its clearly designed menu structure, STRayCi shows self-explanatory functions, which help the user to access quickly standard settings. Incomparable visualization modes, extensive analytical capabilities as well as new developed correction algorithms ensure the highest accuracy in laser beam analysis.
A wide range of beam width techniques e.g. 2nd Moment, Knife Edge, Moving Slit, Plateau, Gauss-Fit can be applied to determine quick and reliable standard beam parameters. The unique measurement tool enables the continuous monitoring of beam parameters, beam position and power density distribution. Helpful features like AOI Tracking, AOI Optimization, Zoom Functions, Look-Up Tables, etc.
The extraordinary graphical and analytical tool of STRayCi can be used for live data (LiveMode) and stored data (SaveMode) simultaneously, while each mode has its own inpidual functions. This makes STRayCi the most advanced analysis software on the market.
STRayCi is equipped with flexible data and image output capabilities. This permits the user to store data and images in the format that is compatible with their needs.
A clearly arranged and printable protocol view displays the chosen measurement parameters as well as the most important laser beam analysis results.
STRayCi is compatible with guidelines of the international standard organization for laser beam measurements:
ISO 11145: Vocabularies and symbols
ISO 11146: Beam width, propagation ratio,…
ISO 11670: Beam positional stability,…
ISO 13694: Beam power density distribution,…
STRayCi works only with a USB software protection lock. It is a hardware based security solutions to protect and encrypt the software against piracy.
MINIMUM SYSTEM REQUIREMENTS:
Windows XP / Vista
Pentium IV / AMD Processor
128 MB graphic card, Open GL V1.4 compatible
100 MB free memory
PCI / PCIe slot for FireWire card
USB port for dongle connection
CD / DVD-ROM drive for software installation
Internet access for update request
STRayCi Special Features
REAL-TIME BEAM PROFILING
2D / 3D intensity plots / Cross sections / Histogram
Pointing stability (x-y fluctuation, COG- position analysis, ect.)
Parameter stability (intensity, power, center x-y, beam size)
Parameter results (beam statistics, beam width, beam parameter)
Multiple camera support
Different measure types
User-selectable exposure time and gain factor, auto-exposure time
Floating average and variable brightness
Beam statistics (power, max intensity, COG, etc.)
Beam width (2nd Moment, Gauss / Super-Gauss-Fits, Plateau, Knife Edge, Moving Slit, ect.)
Beam parameter (beam width, ellipticity, uniformity, etc.)
CALIBRATION AND CORRECTION TOOL
Background subtraction, auto-background
Pixel correction technology (offset correction, linearity, etc.)
User-defined Area of Interest (AOI)
AOI tracking and optimization
Color palettes incl. auto-contrast function
2D profile arithmetic operations, filters, transformations, etc.
Data: txt, tiff
Image: jpeg, png, bmp, gif, tiff
STFE Series Beam Profiler
Beam Profilers are devices that allow the whole optical intensity profile measurement of a laser beam. They retrieve not only the beam diameter and position, but also the full shape of the beam.
We provide two types of beam profilers: BeamPro with large sensors to measure collimated beams and BeamPro with small pixels to measure focused beams.
We take advantage of our user-friendly software, and provides thorough analysis and statistics of your laser beam. The BeamPro software uses standard communication protocols. It is therefore easily integrable in most complex environments. Several BeamPro can be controlled from a remote screen through the network. They are suitable for wavelengths from 190 to 1100 nm and beams as large as 25 mm. There are also high resolution models with pixels as small as 1.67 μm for focused beam measurements.
User-friendly and powerful software
High resolution (up to 24 Mpx)
Small pixel size (down to 1.67 μm)
Large sensor size (up to 25 mm)
The minimum beam diameters are specified for a precision of measurement better than 1%. Smaller beam diameter can be measured but the error will progressively increase.
Depending on the type of calculation, frame rate may vary
Requires the Trigger option
Windowless: Removal of the BeamPro sensor window to avoid potential interferences
UV extension: Increases the BeamPro wavelength range to the UV region, down to 190 nm
Additional ND filters: The default BeamPro configuration includes one ND filter. Additional ones with different specifications can be ordered
Custom version on request: BeamPro based on different type of camera (resolution, pixel size, sensor material) can be developed on request
High dynamic range: Software mode to increase the dynamic of the BeamPro signal acquisition from 12 to 16 bits. Not compatible with pure single-shot measurement as 2 images are necessary to build one beam profile image
Trigger: Synchronization of the BeamPro detection to an external signal for accurate laser single pulse measurement
Vacuum compatible: Possibility to place the BeamPro and perform measurements directly inside a UHV vacuum chamber (not available for all models, please contact us for details)
Thanks to a highly optimized C ++ and Java architecture, the STAR software is fast, touchscreen-enabled, intuitive and user-friendly.
Live extraction of beam properties, even with resolutions larger than 20 Mpix
Several parameters and methods supported (ISO calculation included)
Enhanced background & hot pixels treatment, for optimum dynamic and signal to noise ratio
Client / Server interface, allowing remote control through network
Advanced logging and permanent access to 10 last acquisitions
Live comparison with up to 10 different reference acquisitions
click, completely configurable, export assistant
SFC Series Far Field Beam Scanner
Hemispherical 3D Beam Profiling
The far-field measurement instrument is a stand-alone device for measuring light intensity vs output angle of light emitting components such as high-power laser diodes, LEDs, fibers and other high-intensity light sources.
The SFC series far-field scanner has been designed to fulfill the increasing demands on beam quality analysis and testing of light emitting components. The features of the far-field scanner include wide operating and measuring ranges. This all can be done without sacrificing speed performance – a typical measurement cycle takes only seconds, making it ideal for production testing of light emitting components.
Optical power distribution
Far-field & NA analysis measurement
Quality control of optical sources
Easy setting of scan parameters
Automatic archiving of results
Advanced plotting features: 1D/2D/3D & contour/polar plots
Export of data into various fi le formats: CSV, PDF, PNG, PS, XML, etc.
Numerical analysis of results
Customizable to match customer's needs
Integration into automated measurement systems