Keywords: Laser Beam Meaurement, beam prfiler, beam quality, M2,beamwav
The passive cooled sensor of the STCam is constructed without cover glass to avoid interference patterns. For sensor protection a low distortion neutral density filter is integrated.
High Resolution CCD Beam Profiler
Instant Beam Propagation & Wavefront Analysis
One Shot M2 Measurement
The BeamWave sensors deliver intensity and wavefront measurements simultaneously in an all-in-one device. Instead of using microlens array for wavefront sampling, these sensors are based on Digital Wavefront Technology ®, hence the number of wavefront measurement points is only limited by camera resolution providing a high spatial resolution wavefront, These sensors are typically used for either simultaneous laser beam profiling and beam propagation analysis or high resolution wavefront measurement for optical elements characterization.
With no moving parts or additional accessories, BeamWave® performs all critical laser beam measurements including intensity distribution, wavefront and beam propagation parameters.
High Resolution Beam Profiling
Real Time Wavefront Measurement
On Click Beam Propagation Analysis
Simultaneous high‐resolution intensity & wavefront
One shot M² measurement of both CW and pulsed lasers
Instant measurement of the entire beam over the broad range around focal region
BeamWave sensors come with GetLase® GUI software for Instant diagnostic of all laser beam parameters and GetWave ® GUI software with comprehensive wavefront analysis tools including, Zernike, MTF and PSF. GUI software XP, Vista and Windows 7 compatible, performs intensity and wavefront acquisition in a remarkably fast and easy way and provides comprehensive tools for beam profiling including intensity distribution and beam propagation parameters.
Acquisition & Display
Export & Report
BeamWave sensors come with GetLase® GUI software for Instant diagnostic of all laser beam parameters and GetWave ® GUI software with comprehensive wavefront analysis tools including, Zernike, MTF and PSF.
Successfully used for applications such as:
|Maximum input beam diameter (1/e²), mm||3.2||4.8||6.4||10.88x8.16|
|Beam Intensity Measurements?||CW & Pulsed Lasers in XY for any Z||CW & Pulsed Lasers in XY for any Z||CW & Pulsed Lasers in XY for any Z||CW & Pulsed Lasers in XY for any Z|
|Wavelength range, nm||350 ‐1100||350 ‐1100||350 –1100||2000-16000|
|Measures M²?||CW and Pulsed lasers||CW and Pulsed lasers||CW and Pulsed lasers||CW and Pulsed lasers|
|M²range||1 to >50||1 to >50||1 to >50|
|M²repeatability||< 2%||< 2%||<2%|
|Phase/Wavefront measurements possible?||yes||yes||yes|
|Wavefront and Intensity XY resolution, um||6.45||6.45||6.45||17|
|Wavefront Measurement Points||500 x 500||1392 x 1040||1392 x 1040||640x480|
|Wavefront Sensitivity (λ), rms||0.005||0.005||0.005||0.01|
|Wavefront Accuracy (λ), rms||0.01||0.01||0.001|
|Wavefront Dynamic Range (λ)||1 500||1 500||1800||1500|
|Computer interface||USB 2.0||2 x USB 2.0||USB 2.0||USB 2.0|
|Dimensions, mm||41 x 55 x 80||87 x 161 x 84||114W x 72 x 171||61x67x66|
Our CCD is developed to provide excellent sensitivity from the VIS to NIR spectral range. Thanks to its high resolution and its small pixel size, the STCam is a high performance tool for laser beam analysis of continuous wave (CW) and pulsed laser modes. Due to its high dynamic range the STCam captures even higher laser modes with outstanding detail.
The passive cooled sensor of the STCam is constructed without cover glass to avoid interference patterns. For sensor protection a low distortion neutral density filter is integrated. The STCam supports the ultra-fast FireWire IEEE 1394b interface with data transfer rates up to 800 Mbit/s. The plug and play
design facilitates easy and flexible integration and operation.
The portable STCam is designed to be used in a variety of applications in industry, science, research and development, including:
The enhancement of product quality, process reliability and efficiency are just a few of the many benefits of our unique beam profiler cameras. The STCam includes the specifically designed analysis software, STRayCi, which supports Windows XP/Vista operating systems. Its sophisticated software architecture opens up new opportunities in laser beam analysis according to ISO standards.
The concept of the STCam enables easy adaption to standard optical imaging systems, attenuators and opto-mechanical components ensuring highest flexibility. This includes:
Neutral Density Filter:To expand the power range of the STCam several absorptive and metallic-coated neutral density filters are available, which are specified by optical densities ranging from OD 1.0 to OD 4.0.
FireWire Component:We offer different FireWire PCI / PCI Express cards for installation direct into the PC. Standard FireWire cables are suitable for industrial applications and are available in various lengths.
Trigger Device:To synchronize the STCam with pulsed laser systems, our trigger device is perfectly suited. This frequency and delay generator is software controllable and enables the synchronization of up to four beam profilers with different delay times simultaneously.
|Number of pixel||1388x1038 (1.4MPixel)||1388x1038 (1.4MPixel)||2452x2056 (5MPixel)|
|Spectral response without cover glass||350-1100nm||350-1100nm||350-1100nm|
|Laser beam diameter min/max||46.5/4mm||64.5μm/5mm||34.5μm/5.5mm|
|Bit depth (output)||14Bit||14Bit||14Bit|
|Dynamic (signal to noise)||60dB (1:1000)||67dB (1:2200)||54dB (1:500)|
|Frame rate||up to 15Hz||up to 16Hz||up to 9Hz|
|Interface||FireWire (IEEE1394b)||FireWire (IEEE1394b)||FireWire (IEEE1394b)|
|I / O connector||12-Pin Hirose||12-Pin Hirose||12-Pin Hirose|
|Mode||CW or pulsed||CW or pulsed||CW or pulsed|
|Combinable with||IR-/UV-Converter Beam expander Attenuator||Beam expander Attenuator||Beam expander Attenuator|
|Mechanical dimensions (WxHxL)||60x60x103.8mm||60x60x103.8mm||60x60x103.8mm|
|Electrical requirements||DC 8V-36V||DC 8V-36V||DC 8V-36V|
|Regulations||CE, RoHS||CE, RoHS||CE, RoHS|
* without condensation
Our neutral density filters allow broadband attenuation for a spectral range from VIS to NIR. Due to their excellent surface quality the absorptive and reflective filters enable precise beam attenuation for low power applications. The level of attenuation is specified by the optical density. Filters with different optical densities can be combined. A filter adapter is available to mount the filters on the STCam aperture.
|Reflective ND filter||Absorptive ND filter|
|NDR-10 / NDR-20 / NDR-30 / NDR-40||NDA-10 / NDA-20 / NDA-30 / NDA-40|
|Optical density*||1.0 / 2.0 / 3.0 / 4.0||1.0 / 2.0 / 3.0 / 4.0|
|Spectral range||200nm - 1200nm||400nm - 700nm / 700nm - 1200nm|
|Material||UV-Fused silica (Coating: Metal)||Schott glass|
|Flatness||1λ @ 300nm||λ/10 @ 632.8nm|
|Scratch-Dig||40 - 20||40 - 20|
|Optical density tolerance||±5%||±5%|
|Power (Pmax)||< 1W||< 1W|
|Operating temperature||< 100°C||< 100°C|
|Filter threads||Filter thread / Filter mount||Filter thread / Filter mount|
|Filter adapter||C-Mount thread / Filter thread||C-Mount thread / Filter thread|
The high performance STCL system is based on industry’s unique imaging technique. It is designed for monitoring high-power CO2 lasers in best performance. Thanks to its high resolution and its incomparable real-time capabilities, this highly efficient beam profiler is optimized for laser beam analysis of continuous wave (CW) and pulsed laser systems. The STCL system ensures beam profiling:
The STCL supports the ultra-fast FireWire IEEE 1394a/b interface with data transfer rates up to 800 Mbit/s. The plug and play design facilitates easy and flexible integration and operation.
The compact and portable STCL is designed to be used in a variety of applications in industry, science, research and development, including:
The enhancement of product quality, process reliability and efficiency are just a few of the many benefits of our unique beam profiling system.
The STCL system includes the specifically designed analysis software, STRayCi, which supports Windows XP/Vista operating systems. Its sophisticated software architecture opens up new opportunities in laser beam analysis according to ISO standards.
|Spectral sensitivity:||8μm - 12μm||8μm - 12μm||8μm - 12μm|
|Laser beam diameter (1/e2):||1mm - 10mm||2mm - 15mm||2mm - 15mm|
|Intensity range* :||20W/cm2 - 2.000W/cm2||20W/cm2 - 2.000W/cm2||20W/cm2 - 2.000W/cm2|
|Input power (max):||200W (250W, 30s)||500W (550W, 30s)||500W (550W, 30s)|
|With attenuation unit 0°:||up to 2kW||up to 2kW||up to 2kW|
|With attenuation unit 90°:||up to 2.5kW||up to 3kW||up to 3kW|
|Effective pixel size:||x=39μm / y=36μm||x=55μm / y=51μm||x=30μm / y=29μm|
|Effective pixel size with 2x binning:||x=78μm / y=73μm||x=110μ m / y=102μ m||x=60m / y=58μm|
|Resolution (with 2x binning):||752 x 580pixel (367 x 288pixel)||752 x 580pixel (367 x 288pixel)||1384 x 1038pixel (688 x 518pixel)|
|Frame rate (with 2x binning):||up to 25Hz (up to 50Hz)||up to 25Hz (up to 50Hz)||up to 15Hz (up to 25Hz)|
|Interface:||FireWire (IEEE1394a)||FireWire (IEEE1394a)||FireWire (IEEE1394b)|
|Mode:||CW or pulsed||CW or pulsed||CW or pulsed|
|Mechanical dimensions (WxHxL):||298x141x76mm||340x165x92mm||340x165x92mm|
|Electrical requirements:||AC120V/240V; 48 - 63Hz; 320W||AC120V/240V; 48 - 63Hz; 570W||AC120V/240V; 48 - 63Hz; 570W|
|Storage temperature** :||0°C…+60°C||0°C…+60°C||0°C…+60°C|
|Operating temperature** :||+5°C…+35°C||+5°C…+35°C||+5°C…+35°C|
|Regulations:||CE, RoHs||CE, RoHs||CE, RoHs|
Our sophisticated beam profilers are available with the specifically designed analysis software, STRayCi, which supports Windows XP/Vista operating systems. It is available as 32 Bit / 64 Bit version and can control up to eight beam profiler cameras on a single computer.
Due to its clearly designed menu structure, STRayCi shows self-explanatory functions, which help the user to access quickly standard settings. Incomparable visualization modes, extensive analytical capabilities as well as new developed correction algorithms ensure the highest accuracy in laser beam analysis.
A wide range of beam width techniques e.g. 2nd Moment, Knife Edge, Moving Slit, Plateau, Gauss-Fit can be applied to determine quick and reliable standard beam parameters. The unique measurement tool enables the continuous monitoring of beam parameters, beam position and power density distribution. Helpful features like AOI Tracking, AOI Optimization, Zoom Functions, Look-Up Tables, etc.
The extraordinary graphical and analytical tool of STRayCi can be used for live data (LiveMode) and stored data (SaveMode) simultaneously, while each mode has its own inpidual functions. This makes STRayCi the most advanced analysis software on the market.
STRayCi is equipped with flexible data and image output capabilities. This permits the user to store data and images in the format that is compatible with their needs.
A clearly arranged and printable protocol view displays the chosen measurement parameters as well as the most important laser beam analysis results.
STRayCi is compatible with guidelines of the international standard organization for laser beam measurements:
STRayCi works only with a USB software protection lock. It is a hardware based security solutions to protect and encrypt the software against piracy.
MINIMUM SYSTEM REQUIREMENTS:
STRayCi Special Features
CALIBRATION AND CORRECTION TOOL
Beam Profilers are devices that allow the whole optical intensity profile measurement of a laser beam. They retrieve not only the beam diameter and position, but also the full shape of the beam.
We provide two types of beam profilers: BeamPro with large sensors to measure collimated beams and BeamPro with small pixels to measure focused beams.
We take advantage of our user-friendly software, and provides thorough analysis and statistics of your laser beam. The BeamPro software uses standard communication protocols. It is therefore easily integrable in most complex environments. Several BeamPro can be controlled from a remote screen through the network. They are suitable for wavelengths from 190 to 1100 nm and beams as large as 25 mm. There are also high resolution models with pixels as small as 1.67 μm for focused beam measurements.